Advanced software for the analysis of surface defects

Automatically analyse defects in any image

In Curvature (m¯¹)

or Altitude (μm)

Capture all defects above and below user definable thresholds

Using user definable limits, select and display:-

  1. Number of defects
  2. Surface Area (mm²) – of defects above / below limits
  3. Aspect Ratio – the ratio of defect height and width
  4. Weighted Surface – weighted sum of each defect pixel
  5. Sign – (+/-) direction of defect in the surface
  6. Span Length – maximum length of defect
  7. X/Y Span Length – mid-length of defect in X/Y directions

Overlay defects analysis on original image

Overlay defects analysis on original image